Development of Nano-manipulator based on An Atomic Force Microscopy coupled with a Haptic Device

The Journal of The Institute of Electrical Engineers of Japan

Online ISSN : 1881-4190
Print ISSN : 1340-5551
ISSN-L : 1340-5551

SPECIAL ISSUE on Development of Scanning Probe Microscopy Techniques and It's Applications

Development of Nano-manipulator based on An Atomic Force Microscopy coupled with a Haptic Device

Futoshi IWATA, Tatsuo USHIKI

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JOURNAL FREE ACCESS

2014 Volume 134 Issue 12 Pages 812-815

DOI https://doi.org/10.1541/ieejjournal.134.812

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[in Japanese]

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© 2014 The Institute of Electrical Engineers of Japan

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