The Journal of The Institute of Electrical Engineers of Japan
Online ISSN : 1881-4190
Print ISSN : 1340-5551
ISSN-L : 1340-5551
Technical Review
Evolution of Strain Measurement Technology using Semiconductor Technology
Hiroyuki OTA
Author information
JOURNAL RESTRICTED ACCESS

2023 Volume 143 Issue 11 Pages 714-717

Details
Abstract

[in Japanese]

Content from these authors
© 2023 The Institute of Electrical Engineers of Japan
Previous article Next article
feedback
Top