Analyzing Method of the Quantity of Material Loss and Value of Contact Resistance in the Life Test & Method of Life Test for Weak Current Cntacts
1954 Volume 74 Issue 792 Pages 1064-1074
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1954 Volume 74 Issue 792 Pages 1064-1074
IEEJ Transactions on Sensors and Micromachines
IEEJ Transactions on Industry Applications
IEEJ Transactions on Electronics, Information and Systems
IEEJ Transactions on Power and Energy
IEEJ Transactions on Fundamentals and Materials
The Journal of The Institute of Electrical Engineers of Japan
The transactions of the Institute of Electrical Engineers of Japan.C
The transactions of the Institute of Electrical Engineers of Japan.B
The transactions of the Institute of Electrical Engineers of Japan.A
