IEEJ Transactions on Power and Energy
Online ISSN : 1348-8147
Print ISSN : 0385-4213
ISSN-L : 0385-4213
Paper
Degradation Characteristics of O-rings on Highly Aged GIS
Tadao MinagawaEiichi NagaoEi TsuchieHiroshi YonezawaDaisuke TakayamaYutaka Yamakawa
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2005 Volume 125 Issue 3 Pages 322-330

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Abstract

Owing to increasing number of highly aged GIS, the investigation of the remaining lifetimes of those systems are becoming more important. Because a lot of O-rings are used in GIS, the study of degradation mechanism and lifetime estimation method of O-ring is essential. In this paper, the information about O-ring degradation mechanism is described, and the statistical method for estimating the remaining lifetime of O-ring is proposed. The degradation of O-ring is mainly subject to chemical reactions triggered by oxygen. Because there are many factors influencing those chemical reactions, the dispersion of degradation rates of O-rings in GIS is very large. Consequently the statistical analysis is one of the effective techniques for lifetime estimation of O-rings in GIS.

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© 2005 by the Institute of Electrical Engineers of Japan
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