2018 年 138 巻 6 号 p. 514-520
In order to produce electric power with the highest efficiency from PV modules, it is necessary to operate at a Maximum Power Point (MPP). However, the MPP changes and is affected by external factors such as the of temperature and solar irradiance. In solving the problem, PV modules are in need of Maximum Power Point Tracking (MPPT) such as the perturb and observe method and the I-V characteristics scanning type of MPPT. The latter technique is accurate but it requires a certain time to mesure I-V characteristics and it causes power generation loss. But, the response speed is limited by the measurement system rather algorithm. In this paper, we propose a new MPPT method to solve these problems. This is based on estimating the I-V characteristic by using an equivalent circuit model of PV module. This method is capable of high-speed response and does not equire scanning of I-V characteristics. By experiments, we have demonstrated that the scan-less MPPT at 260ms intervals and that its Useful Utilization Factor (UUF) is 99.9 These performances are equivalent to those of the MPPT method measuring the I-V characteristics directly.
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