IEEJ Transactions on Sensors and Micromachines
Online ISSN : 1347-5525
Print ISSN : 1341-8939
ISSN-L : 1341-8939
Special Issue Review
Reliability Characterization of MEMS Materials
Toshiyuki Tsuchiya
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2005 Volume 125 Issue 7 Pages 289-293

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Abstract

This review describes the testing,analyzing,and evaluating methods for the mechanical reliability of MEMS materials,which has much more importance on the commercialization of MEMS devices that has tiny mechanical structures. The reliability of silicon,the most often used materials as structure in MEMS,is also summarized.

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© 2005 by the Institute of Electrical Engineers of Japan
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