International Journal of Automation Technology
Online ISSN : 1883-8022
Print ISSN : 1881-7629
ISSN-L : 1881-7629
Special Issue on Measurement Technology for Process and Product Quality Control
Special Issue on Measurement Technology for Process and Product Quality Control
Yasuhiro TakayaTomohiko Maeda
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ジャーナル オープンアクセス

2014 年 8 巻 1 号 p. 3

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A broad sense of values, globalization, and ecology is needed in production activities because production processes are becoming rapidly more complex due to demands for downsizing, functionality, quality. This is in addition to cost reduction, shorter lead times, and energy saving in fabrication. Many types of measurement system and large amounts of production information are therefore needed in production engineering.

In-process and on-machine measurements are used to evaluate a variety of machining factors and conditions and work done on machine tools. With increasingly complex machining processes and greater needs for accuracy and precision, the demand for advances in process optimization has also grown.

This special issue covers manufacturing metrology and quality management as its two main fields of interest, together with their important implications for science, industry, and engineering. This special issue also covers novel in-process and on-machine measurement and sensing and quality management techniques now being widely applied to production engineering, focusing on the important role of measurement in manufacturing technology as it progresses from inspection tools to strategic production tools in managing process quality and product quality control. The advanced papers in this special issue present the latest advancements in these fields, ranging from fundamental research to industrial applications. These reports will thus enable readers to share their experience and knowledge in technology, new development, and potential applications of promising techniques in measurement and in product and process quality control.

We thank the authors for their invaluable contributions and the reviewers for their always useful advice, which have helped make this special issue both fascinating and far-reaching.

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