CMM Dynamic Properties of the Scanning Measurement of a 2D Profile

抄録

Scanning probe CMMs have come to be considered the standard in coordinate metrology, not only because they provide high-quantity, high-speed data gathering but also because the scanning technology significantly decreases inspection time. Modern manufacturing, especially in today’s highly competitive economy, requires increasingly efficient measuring machines and processes because inspection machines have often become the bottlenecks in the entire manufacturing processes. More efficient coordinate metrology can mean faster measurement cycles with acceptable accuracies. However, increasing scanning speeds has also significantly increased errors. This article proposes a new method of investigating and identifying the principal components of CMM dynamic errors. The principle of the method is presented, and the validity of the method is experimentally confirmed on a bridge coordinate measuring machine.