International Journal of Microgravity Science and Application
Online ISSN : 2188-9783
Accurate Synchrotron Hard X-ray Diffraction Measurements on High-Temperature Liquid Oxides
Koji OHARA Yohei ONODERAShinji KOHARAChihiro KOYAMAAtsunobu MASUNOAkitoshi MIZUNOJumpei T. OKADAShuta TAHARAYuki WATANABEHirohisa ODAYui NAKATAHaruka TAMARUTakehiko ISHIKAWAOsami SAKATA
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ジャーナル オープンアクセス

2020 年 37 巻 2 号 p. 370202-

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Understanding liquid structures provides crucial information for uncovering the nature of glass transition. We adopted a combination of the aerodynamic levitation technique and the synchrotron hard X-rays to reveal the structure of high-temperature liquid oxides. To achieve accurate diffraction measurements, the two-axis diffractometer at the high-energy X-ray diffraction beamline BL04B2 of SPring-8 was upgraded. By installing four CdTe detectors and three Ge detectors, we can measure diffraction signals from levitated liquids approximately three times faster than the previous set-up. We have measured liquid (l)-Y2O3, l-Gd2O3 and l-Ho2O3. No first sharp diffraction peak (FSDP) was observed in these non-glass forming liquids but a sharp principal peak (PP) was observed. Density data on these liquids necessary for further analysis are currently measured using the electrostatic levitation furnace in the International Space Station (ISS).
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© 2020 The Japan Society of Microgravity Application
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