Quantitative Analysis of Nb in Steel Utilizing XRF-yield XAFS Edge Jump

Masayasu Nagoshi; Tomohiro Aoyama; Yuji Tanaka; Tomoharu Ishida; Satoshi Kinoshiro; Katsumi Kobayashi

doi:10.2355/isijinternational.53.2197

Regular Article

Quantitative Analysis of Nb in Steel Utilizing XRF-yield XAFS Edge Jump

Masayasu Nagoshi , Tomohiro Aoyama, Yuji Tanaka, Tomoharu Ishida, Satoshi Kinoshiro, Katsumi Kobayashi

著者情報

キーワード: XAFS, XRF, EXAFS, synchrotron radiation, quantitative analysis, chemical state analysis, micro alloy, trace elements, Nb, segregation

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2013 年 53 巻 12 号 p. 2197-2200

DOI https://doi.org/10.2355/isijinternational.53.2197

詳細

抄録

X-ray fluorescence (XRF) yield x-ray absorption fine structures (XAFS) have been investigated in terms of quantitative analysis for steel sheets containing 31–2100 ppm of Nb. Nb concentrations in the samples were determined with high accuracy from the height of the K-edge jump. The detection limit was estimated down to the single digit ppm range. The combination of this technique with the conventional extended x-ray absorption fine structure (EXAFS) analysis for an identical XAFS spectrum provides both quantity and chemical state information of trace elements in the given volume of steel samples.

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