Fundamental and Application of Surface analysis (IV)

Abstract

We describe “Elemental analysis method” of metallic cross-sectional microstructure by EPMA, Electron Probe Micro-Analyzer.

We describe the “X-ray spectroscope” as most important parts and a location of “X-ray spectroscope” in the EPMA. Effect of a asperity and irregularity at the surface of analyzed specimen on a quality of an elemental analysis results are described. And we described the effect of location relationship between brazed interface at the analyzed specimen surface and “X-ray spectroscope” on a quality of an elemental analysis results.