電子写真学会誌
Online ISSN : 1880-5108
Print ISSN : 0387-916X
ISSN-L : 0387-916X
報文
HR-CVD法によるシリコン薄膜の作製
—アモルファスからエピタキシャル成長まで—
福田 加一大利 博和半那 純一小田 俊理清水 勇
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1987 年 26 巻 2 号 p. 137-144

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We have grown thin films of silicon from fluorides under controlling atomic hydrogen concentration in the gas phase. Both amorphous and crystalline films has been successfully obtained. Highly [110] axis oriented polycrystalline silicon films have been grown at high growth rate of about 20 A/s on glass substrates at 300°C. Epitaxially grown crystalline silicon has also been obtained on (100) Si and (110) Si substrates at the same temperature. To obtain high quality crystallized films, it is found to be important to control the chemical reaction both in the gas phase and in the growing surface.
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© 1987 一般社団法人 日本画像学会
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