抄録
D. C. transient currents under low-voltage application were measured for various organic layered photoreceptors with different ionization potentials of charge generation (CGM) and charge transport materials (CTM) in order to elucidate their energy level matching for carrier injection. It was observed that the hole injection occurred efficiently between CGM and CTM having the same ionization potentials. These results corresponded well to the residual potentials rather than photosensitivities in the xerographic measurment of these photoreceptors. The D. C. transient current measurment was shown to be useful to obtain the information about carrier injection paths through the various energy states of charge generation layer (CGL).
