Abstract
Thulium doped yttrium oxide(Y_2O_3:Tm) thin films were grown up on amorphous quartz and ITO glass substrates employing electron-beam evaporation technique. Structural characterization was carried out at various substrate and annealing temperatures. Y_2O_3:Tm was evaluated by its cathodoluminescent spectra, chromaticity, luminance at low voltage excitation(<5kV)