10-8 Efficiency of CCD damage by different radiation : theoretical review

Yuri D. Kotov; Masaaki Sasada

doi:10.11485/iteac.2000.0_149

PROCEEDINGS OF THE ITE ANNUAL CONVENTION

Online ISSN : 2424-2292
Print ISSN : 1343-1846
ISSN-L : 1343-1846

2000

Session ID : 10-8

DOI https://doi.org/10.11485/iteac.2000.0_149

Conference information

Name : 2000 ITE Annual Convention

Location : [in Japanese]

Date : August 23, 2000 - August 25, 2000

10-8 Efficiency of CCD damage by different radiation : theoretical review

Yuri D. Kotov, Masaaki Sasada

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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract

Analysis of physical processes responsible for generation of induced dark current in CCD is presented. Ionization and Nonionization energy losses as well as the damage energy distribution for single interaction of protons, Si ions and neutrons is given. Different inaccuracies of the models and predictions are discussed.

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