Abstract
The relationship between c-axis orientation of crystallites and distribution of the perpendicular coercivity H_<c⊥> in Co-Cr films has been investigated through the evaluation of the H_<c⊥> of surface layer measured by Kerr hysteresis loop tracer. Higher Cr content and adequate addition of Ta seemed to be essential requirements to get higher coercivity of initial growth layer and good uniformity of H_<c⊥> through thickness direction. Co_<67>Cr_<33> underlayers and Ti underlayers were effective to attain better c-axis orientation of Co-Cr films deposited on them. However, such a good crystallinity in the Co-Cr films did not cause the large H_<c⊥>. Ti underlayers were effective to attain better recording characteristics.
