Abstract
We show an optimization design of temperature sensor which keeps the temperature error fluctuation within a desired fluctuation and minimize the area. We express the transfer function of temperature error fluctuation as the device fluctuation function by establishing a system model of the circuit and replacing the device fluctuation function to the area function by using pelgrom coefficient. Thereby the transfer function of the temperature error fluctuation expresses an area function. It is possible to keep the temperature error fluctuation within a desired fluctuation without useless area increase by analyzing the trade-off between the area and the temperature error fluctuation theoretically using this transfer function of the temperature error fluctuation expressed as an area function. As a result, we kept 3σ of the temperature error fluctuation within ±1.4℃ from +50 to +125℃ against design value ±3.6℃, and the area was 0.37mm^2 (including IO). By this fact, we proved this design method was effective.
