A Low Read Noise High Conversion Gain CMOS Image Sensors using Reset-Gate-Less Pixel

抄録

A deep sub-electron read noise level and high sensitivity reset-gate-less (RGL) pixel CMOS image sensor (CIS) using bootstrapping reset is developed. A 0.5Mpixel RGL pixel image sensor with noise-robust column readout circuit based on correlated multiple sampling (CMS) technique has achieved a low read noise of 0.44e-rms (peak) at 300K, a wide dynamic range (DR) of 72.3dB, and a high sensitivity of 75ke-/lx-sec. The implemented CIS using a 0.11µm technology has also a high pixel conversion gain (CG) of 172µV/e-, thanks to the unique RG-less pixel structure, and it assists to improve the sensor noise performance.