Proceedings of the 50th Japan Joint Automatic Control Conference
Session ID : 518
Conference information
Host: The Japan Society of Mechanical Engineers, The Society of Instrument and Control Engineers, The Institute of Systems, Control and Information Engineers, The Society of Chemical Engineers, Japan, The Japan Society for Precision Engineering, The Japan Society for Aeronautical and Space Sciences
Co-host: Technically Cosponsored by 42 Societies and Institutes
GS9 Image Processing and Applications
Development of metal thin film standard for a X-ray fluorescence thickness meter
Details
