抄録
In modern high-performance ICs, some structures such as Power-Bus Structure are used. Through such structures noise results from device switching as well as other reasons can easily propagate and may cause signal integrity (SI) and electromagnetic interference (EMI) problems. Decoupling Capacitors are commonly used to mitigate this noise.In this work we simulated decoupling capacitors by using the FDTD method. Compared the simulated results with the measured results of S21, the capacitors do show the decoupling characteristics. Some further improvements are also suggested.
