抄録
A refinement technique of X-ray diffraction profiles was applied to the quantitative analysis of a preferentially oriented particle with a layer structure in the plane of a sample-holder. This approach seems to be superior to the previous methods where special techniques of sample preparation are required to reduce the effects of preferred orientation. The present approach suggested that the effects of preferred orientation could be cancelled out by correcting the observed intensity for the various reflections using a predetermined orientation distribution function of plate-like samples. To study the influence of stacking disorder in minerals on the quantitative analysis, a fundamental equation in X-ray powder diffraction method was also developed on the basis of the one dimensional stacking disorder theory. To make the quantitative check of the present method, two samples were prepared; muscovite and quartz. They were crushed and sieved into different particle size ranges, such as -2, 3-5, 5-10, 2-10 and 20-40μm. In the two component systems with various mixing ratios, the validity of the present method was confirmed with refinement of the entire X-ray intensity profiles for every admixture in which each mineral was weighed earlier. The discrepancy between the calculated and prepared mineral compositions was within 6 weight percent for all mixtures.
