X線トポグラフ法による単結晶アルミナ破面の転位の同定
1999 年 107 巻 1251 号 p. 1063-1066
詳細
1999 年 107 巻 1251 号 p. 1063-1066
X-ray topographic images of several refraction planes of single crystal alumina were taken with the reflection Berg-Barret technique of X-ray topography. Linear contrasts were observed in X-ray topographic images of fracture surfaces of single crystal alumina. It was shown that dislocations were produced due to the fracture of single crystal alumina even at the room temperature. The comparison among X-ray topograph images made it clear that there were dislocations with several types of Burgers vector near the fracture surface of single crystal alumina, and about 70% of the dislocations were the basal dislocations. X-ray topography is shown to be a powerful technique for obtaining information about dislocations near by the fracture surface of ceramics.
