Angle resolved total reflection fluorescence XAFS and its application to Au clusters on TiO₂(110) (1 × 1)

抄録

The bonding features and three dimensional structures of metal clusters on single crystal oxide surfaces can be determined by the polarization dependent total reflection fluorescence XAFS (PTRF-XAFS) method. K-edge XAFS has a cos² θ polarization-dependence to give successfully three dimensional structure while L₃ edge XAFS has a weaker polarization dependence though the L₃ edge is suitable for Au and Pt samples. In order to overcome this issue, we have developed an angle-resolved total reflection fluorescence XAFS (ARTRF-XAFS) method to determine more precise three dimensional structures of Au clusters using the L₃ edge by increase the number of data points. In this paper we described the methodologies of the ARTRF-XAFS and the results of Au clusters on the TiO₂(110) surface.