Thickness Dependence on the Coercive Field in Ferroelectric Thin Films

Kwok Tung LI; Veng Cheong LO

doi:10.14852/jcersjsuppl.112.0.S439.0

Journal of the Ceramic Society of Japan, Supplement 112-1, PacRim5 Special Issue

Session ID : 6

DOI https://doi.org/10.14852/jcersjsuppl.112.0.S439.0

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Host: The Ceramic Society of Japan

Co-host: Iketani Science and Technology Foundation, International Ceramic Federation, Commemorative Organization for the Japan World Exposition '70, The American Ceramic Society, The Australasian Ceramic Society, The Chinese Ceramic Society, The Korean Ceramic Society, Joint Research Consortium of Synergy Ceramics/Fine Ceramics Research Association, Nanotechnology Researchers Network Center of Japan, The Special Coordination Funds for Promoting Science and Technology, Japan National Tourist Organization, Aichi Prefectural Government, CASIO SCIENCE PROMOTION FOUNDATION, DAIKO FOUNDATION, Nagoya Convention and Visitors Bureau, The Asahi Glass Foundation, The Kao Foundation For Arts And Sciences, The Murata Science Foundation, The Ogasawara Foundation for the Promotion of Science & Engineering, ASAHI GLASS CO., LTD. Research Center, CENTRAL GLASS CO., LTD., ELECTRIC GLASS INDUSTRY ASSOCIATION OF JAPAN (EGAJ), Hattori Company, Ltd., Hitachi Research Laboratory, Hitachi, Ltd., HOYA CORPORATION, INAX Corporation, ITOCHU CERATECH CORP., Japan Cement Association, KYOCERA Corporation, KYUSHU REFRACTORIES CO., LTD., MINO CERAMIC CO., LTD., Murata Manufacturing Co., Ltd., NGK INSULATORS LTD., NGK SPARK PLUG CO., LTD., NICHIAS Corporation, NIKKO COMPANY, Nippon Electric Glass Co., Ltd., Nippon Sheet Glass Co., Ltd., NORITAKE CO., LIMITED, Tokuyama Corporation, TOTO LTD.

Papers

Thickness Dependence on the Coercive Field in Ferroelectric Thin Films

Kwok Tung LI, Veng Cheong LO

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Keywords: Thickness dependence, Four-state Potts model, Coercive field, Remanent polarization, Ferroelectric thin films

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Abstract

Thickness dependence of coercive field (E_C) and remanent polarization (P_r) in ferroelectric thin films has been numerically simulated using four-state Potts model. In this model, four mutually perpendicular dipole-orientations result in four different kinds of domains. The thickness dependence is induced by the influence of the surface dipoles. These dipoles have slightly different physical parameters due to the interfacial effects. The simulation result shows the existence of a maximum coercive field at the critical thickness (d_C) for the coercive field against thickness (d) curve. For the thickness d<d_C, E_C increases with d. On the other hand, for d>d_C, an opposite trend can be obtained.

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