Corrosion Tests for Plastic Packaged LSI

Toshinori Ozaki; Yuichi Ishikawa

doi:10.3323/jcorr1991.40.57

Corrosion Engineering

Online ISSN : 1881-9664
Print ISSN : 0917-0480
ISSN-L : 0917-0480

Corrosion Tests for Plastic Packaged LSI

Toshinori Ozaki, Yuichi Ishikawa

Author information

Keywords: corrosion damage of electronics components, semi-conductor, LSI, plastic encapsulation, micro-corrosion, reliability of the LSI, corrosion prevention

JOURNAL FREE ACCESS

1991 Volume 40 Issue 1 Pages 57-65

DOI https://doi.org/10.3323/jcorr1991.40.57

Details

Abstract

Corrosion problems of electronics conponents have been become important in the reliability of the several machines and systems. In this paper, the corrosion mechanism for plastic packaged LSI and its testing methods is discussed. It is shown the materials selection and designing for the plastic packaged LSI are protected from corrosion damage in humidity environments are seemed to actual actions.

Content from these authors

Favorites & Alerts

Corresponding author

Register with J-STAGE for free!