X線マイクロアナリシス (EPMA)
1992 年 41 巻 11 号 p. 764-773
詳細
1992 年 41 巻 11 号 p. 764-773
X-ray microanalysis provides useful information on the identification, location and quantitation of elements within a sample down to the micrometer level of size.
Described in this article are the principle, sample preparation, quantitation, state analysis and the related applications such as sectional analysis of the filiform corrosion and individual image presentation of CuO and Cu2O.
