抄録
The aspects of surface analytical techniques by detecting outcoming electrons from samples were summarized to get acquainted to the fundamental knowledge of typical electron microscopes-scanning electron microscope, scanning transmission electron microscope, transmission electron microscope, spin polarized scanning electron microscope, analytical electron microscope and scanning tunneling microscope-, electron spectrometry-electron energy loss spectrometry, high resolution electron energy loss spectrometry, Auger electron spectrometry, X ray photoelectron spectrometry (X ray electron spectrometry, electron spectrometry for chemical analysis), conversion electron Mossbauer spectrometry- and electron diffractometry-low energy electron diffractometry, reflection high energy electron diffractometry-. Electron or photon induced current methods for analysing n-p junction, and positron annihilation technique for analysing atomic vacancy type defects were also mentioned.
