X-ray Photoelectron Spectroscopy (XPS)

Hidetaka Konno

doi:10.3323/jcorr1991.42.27

Corrosion Engineering

Online ISSN : 1881-9664
Print ISSN : 0917-0480
ISSN-L : 0917-0480

X-ray Photoelectron Spectroscopy (XPS)

Hidetaka Konno

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Keywords: X-ray photoelectron spectroscopy, reduction by X-ray, chemical shift, charge up effect, peak separation, satellite peak, Auger parameter, relative sensitivity factor, back-ground substraction, ion sputtering

JOURNAL FREE ACCESS

1993 Volume 42 Issue 1 Pages 27-36

DOI https://doi.org/10.3323/jcorr1991.42.27

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Abstract

Application of X-ray photoelectron spectroscopy (XPS) to corrosion science was introduced in both qualitative and semiquantitative aspects. In particular, abilities and limitations as a surface analytical technique were explained with practical examples.

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