イオンビーム散乱による結晶表面の研究
1986 年 28 巻 4 号 p. 273-280
詳細
1986 年 28 巻 4 号 p. 273-280
Recent development of ion scattering technique for study of the atomic arrangement of crystal surface is reviewed. Basic problems in the technique, both for keV ions and for MeV ions, are explained and some of the new ideas are mentioned for the further development of the technique. [J. Cryst. Soc. Jpn. 28, 273 (1986) ] .
