球面収差補正による高分解能電子顕微鏡法の分解能向上
2005 年 47 巻 1 号 p. 20-25
詳細
2005 年 47 巻 1 号 p. 20-25
Recent development of spherical aberration correction in high-resolution electron microscopy (Cs-corrected HREM) is reviewed by focusing on TEM instruments. Basis of the the previous HRTEM and new scientific elements for Cs-corrected one are summarized, and recent applications of the method to nano materials and interfaces are described through explaining its characteristic and the future prospects.
