走査型ホール素子顕微鏡による超伝導線材の局所J_c 分布評価

抄録

This article reviews a method for characterizing the local critical current density (J_c) distribution in superconducting tapes and wires based on scanning Hall-probe microscopy (SHPM). This method is very powerful for (1) finding the bottleneck that limits the global performance of a superconductor, (2) investigating the local inhomogeneity that may become the origin of local quench, especially in HTS applications, (3) establishing the processes for narrow and/or multifilamentary HTS conductors for reducing the magnetization in magnet applications and the AC losses in power applications. The principle and the functions of this technique are introduced by referring to characterization examples of REBCO coated conductors and an MgB₂ wire.