1992 年 27 巻 2 号 p. 152-157
Resistance vs. temperature relations of 200 carbon resistors (Allen Bradley 100Ω, 1/8W), widely used for cryogenic temperature measurements, were investigated in the range between liquid helium temperature and 20K. Obtained data are statistically evaluated, and it is apparently shown that the difference of the carbon resistor's lot affects the resistance value at the cryogenic temperatures. Four empirical formulas for the resistance vs. temperature relation proposed by other researchers are evaluated. According to this result, the equation, logR+K/logR=A+B/T, proposed by Clement et al. has most precise fitting below 10K. The authors propose a new empirical equation by applying Clement's equation. It is found that the three undecided coefficients, A, B and K of the equation can be calculated from the resistance at 4.2K alone, thus enabling one-point calibration at liquid helium temperature. Resistance changes caused by ten times temperature cyclings from room temperature to liquid helium temperature are also measured. These are within -0.05-+0.02K, though measurments are slightly diverged by temperature cyclings.