TEION KOGAKU (Journal of Cryogenics and Superconductivity Society of Japan)
Online ISSN : 1880-0408
Print ISSN : 0389-2441
ISSN-L : 0389-2441
Temperature Rise Associated with a Disturbed Electric Current in a Cracked Stabilizer at Low Temperatures
Sei UEDA
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2000 Volume 35 Issue 8 Pages 419-423

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Abstract
This paper discusses the temperature rise in a conducting plate containing a through crack under a uniform electricity flow at low temperatures. The current flow is disturbed by the presence of the crack and the extreme temperature rise is caused by the disturbed current. Using a finite element method, the disturbed current and temperature rise in the plate are calculated with temperature-dependent properties and the numerical results on the temperature rise are presented in graphical form. Results obtained by a finite element method without temperature-dependent properties are found to be in excellent agreement with the exact solutions of the problem, and the maximum temperature rise, which is independent of the geometric parameters, occurs at the crack tip.
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© Cryogenic Association of Japan
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