耳鼻咽喉科臨床
Online ISSN : 1884-4545
Print ISSN : 0032-6313
ISSN-L : 0032-6313
慢性副鼻腔炎におけるレ線的上顎洞粘膜機能検査 (X-MFT) と定量的表面微細構造との比較的研究
伊藤 博間島 雄一坂倉 康夫三吉 康郎
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1984 年 77 巻 6 号 p. 1375-1380

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Quantitative scanning electron microscopy was used to examine the maxillary sinus mucosa of 18 patients (20 specimens) with chronic maxillary sinusitis, and the results were compared with those of the X-ray mucous membrane function test (X-MFT). In the scanning electron microscopic study, the epithelial surfaces occupied by cilia were calculated by an image analyzer. The pathologic condition of the maxillary sinus was evaluated by the radiographic appearance after the introduction of contrast medium into the maxillary sinus. The X-ray images (X-MFT) were classified as mild, moderate and severe. The epithelial surface occupied by cilia in the mild, moderate and severe lesions was 96.5±3.5%, 92.5±8.3% and 37.±31.7%, respectively. The ciliated area decreased exponentially with the severity as evaluated by the contrast X-ray study. Eleven specimens of maxillary sinus mucosa were obtained by biopsy through the inferior nasal meatus with Nishihata forceps, and nine specimens were obtained during radical surgery. There was no significant difference in the area occupied by cilia in the tissues obtained by these two methods. The results indicate that the quantitative scanning electron microscopic appearance of the maxillary sinus mucosa is useful in the evaluation of pathologic conditions of the maxillary sinus mucosa.
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