A Study on a Test Method of Ion Migration on PC Board Surface Where Condensation Occured

The Journal of Japan Institute for Interconnecting and Packaging Electronic Circuits

Online ISSN : 1884-1201
Print ISSN : 1341-0571
ISSN-L : 1341-0571

Yoshikazu KOBAYASHI

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JOURNAL FREE ACCESS

1996 Volume 11 Issue 1 Pages 48-52

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[in Japanese]

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