Reducing Cracking in Solder Joint Interfacial Cu6Sn5 with Modified Reflow Profile

Flora Somidin; Stuart David McDonald; Xiaozhou Ye; Dongdong Qu; Keith Sweatman; Tetsuya Akaiwa; Tetsuro Nishimura; Kazuhiro Nogita

doi:10.5104/jiepeng.13.E19-004-1

Technical Papers

Reducing Cracking in Solder Joint Interfacial Cu₆Sn₅ with Modified Reflow Profile

Flora Somidin, Stuart David McDonald, Xiaozhou Ye, Dongdong Qu, Keith Sweatman, Tetsuya Akaiwa, Tetsuro Nishimura, Kazuhiro Nogita

Author information

Flora Somidin
Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland
Centre of Excellence Geopolymer and Green Technology, School of Materials Engineering, Universiti Malaysia Perlis (UniMAP)
Stuart David McDonald
Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland
Xiaozhou Ye
Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland
Dongdong Qu
Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland
Keith Sweatman
Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland
Nihon Superior Co. Ltd.
Tetsuya Akaiwa
Nihon Superior Co. Ltd.
Tetsuro Nishimura
Nihon Superior Co. Ltd.
Kazuhiro Nogita
Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland

Keywords: Sn-3, 0Ag-0, 5Cu, Sn-0, 7Cu-0, 05Ni-1, 5Bi, Time-Temperature-Transformation, Microstructure, Reliability

JOURNAL FREE ACCESS

2020 Volume 13 Pages E19-004-1-E19-004-11

DOI https://doi.org/10.5104/jiepeng.13.E19-004-1

Details

Abstract

The polymorphic transformation that occurs in the Cu₆Sn₅ intermetallic compound (IMC) at 186°C has the potential to generate stresses that could lead to cracking of that phase in soldered joints during the multiple reflow cycles of a typical printed board assembly process and the thermal cycles to which electronic assemblies are exposed during service. In this paper the authors report on the effect of variations in the cooling stage of a reflow soldering thermal profile on the incidence and extent of cracking in the Cu₆Sn₅ at the interface between solder alloys and copper substrates. The solder alloy/substrate combinations studied were Sn-3.0Ag-0.5Cu/Cu and Sn-0.7Cu-0.05Ni-1.5Bi/Cu. The cooling conditions were (i) the direct-cooling of a conventional reflow profile, and (ii) an alternative reflow profile with one of three extended isothermal holding periods of 30, 60, and 180 seconds at 140°C during the cooling stage. It was found that the alternative reflow profiles reduced cracking in the interfacial Cu₆Sn₅ IMC layer and this resulted in improved resistance of the reflowed solder ball to failure in high speed impact shear when the distribution of stress tends to favor crack propagation though the interfacial IMC rather than through the bulk solder.

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