Abstract
The infrared thermographs have become common for temperature measurement of electronic components that are used in electronic devices. Most of electronic device designers using the infrared thermograph know well such fundamental matter like adjusting the emissivity beforehand.
However, the capability of the infrared thermograph for the peak temperature measurement of a micro target is not much considered. Additionally, there is no infrared thermograph manufacturer that clearly specifies this performance. Under such circumstances, it is doubtful that the correct temperature of the micro electronic component is measured or not.
In this study, a method has been proposed, by which electronic device designers can estimate the spatial peak detection capability of a thermograph only by using equipment that are readily-accessible.
