Abstract
For the purpose of the analysis of silicon and copper in high purity aluminium, the colorimetric analysis is established in JIS H 1301, but this method can not satisfy the requirement in practical works because it takes a long time to get the result.
The purpose of this investigation is to establish a technique for the quantitative analysis of silicon or copper by emision spectrochemical analysis using "pin to plane" intermittent A.C.-arc source unit.
The results obtained are as follows.
(1) Most suitable condition of excitation is-current 6Å, intermittent ratio 1/4×1/sec, and exposure time 6see.
(2) When ISi 2881.58Å/IIAl 2669.17Å and I 2506.90Å/IIAl 2669.17Å are used as analytical line pairs, 0.0005-0.060% of silicon can be analysed.
(3) When ICu 3273.96Å/IIAl 2669.17Å are used as analytical line pair 0.0004-0.004% of copper can be analysed.
(4) The variation coefficient by this method is 5-10% in case of silicon and 10-20% in the case of copper. The accuracy obtained from this method is sufficient enough for industrial application and it saves the time to one-tenth of the chemical analysis by JIS H 1301.
