Journal of Japan Industrial Management Association
Online ISSN : 2432-9983
Print ISSN : 0386-4812
A New Goodness-of-Fit Test for the Doubly Exponential Distribution Based on Sample Entropy
Masaaki TSUJITANIHiroshi OHTAShigeo KASE
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1979 Volume 30 Issue 3 Pages 214-218

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Abstract
A new test of fit for the doubly exponential distribution with unknown parameters is proposed. This test, based on sample entropy, has the desirable properties compared with several nonparametric tests and the Mann test. The propoosed test statistic is easily calculated by use of the minimum variance linear unbiased estimator andcan beapplicable to the censored samples.
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© 1979 Japan Industrial Management Association
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