オーバービュー（解説論文）
表面・界面の物理解析技術
キーワード:
surface analysis,
interface analysis,
electron microscopy,
electron spectroscopy,
material characterization
2014 年 78 巻 11 号 p. 401-407
詳細
2014 年 78 巻 11 号 p. 401-407
Surface and interface analysis techniques are reviewed mainly about electron microscopy and surface analysis methods. The principal of the techniques, fundamental and preferable way of using them, some examples, and future prospects of them are presented.
