Abstract
Using single crystals of tin grown in the [100] and [001] directions, the relation between the substructure and the crystallographic orientation was examined by means of X-ray diffraction microscopy. As in the previous reports, the linear substructures, detected by the X-ray microscopy, developed from the reticulate substructures and their orientation difference increased with the growth. In this case, the increase of the orientation differences was accelerated by the formation of new corrugations along the linear subboundaries.
