1971 年 35 巻 10 号 p. 1001-1007
The size of a platelike G.P.(1) zone in Al-Cu alloys has been investigated by the X-ray small-angle scattering photographic method. As its applications, the growth behaviour of G.P.zones in different ageing temperatures, the relation between its size and the peak of electrical resistivity ageing curves and the effects of Sn addition on the G.P.(1) zone formation and growth have also been investigated.
In order to measure precisely the scattered intensity around the direct beam, it is essential to minimize the shadow part by the beam stopper. In this research the upper limit of the determined diameter was about 60 Å.
On the growth behaviour of G.P.(1) zones in the binary Al-Cu alloy, a clear difference between 100° and 135°C was found. For the contribution of G.P.zones to the peak on the resistivity ageing curve it was shown that the critical diameter for the peak appears to be larger than 50 Å, in contrast with the case of the spherical zones in Al-Ag or Al-Zn alloys. The effects of 0.12 wt%Sn addition on the growth of G.P.(1) zones was found to be dependent on the ageing temperatures.