光電子分光法による珪酸塩中のO0, O−およびO2−イオンの定量分析のための基礎的研究
1977 年 41 巻 4 号 p. 375-380
詳細
1977 年 41 巻 4 号 p. 375-380
A fundamental study was carried out in order to find out the method of fixed quantity on three kinds of oxygen ions, i.e. O0 (bridged oxygen), O− (non-bridged oxygen) and O2− (free oxygen), exsisting in the vitreous silicate. Therefore, the binding energies of oxygen Ols electrons for various oxides and mono-silicate compounds were determined by using X-ray photoelectron spectroscopy (XPS). The main results obtained were as follows:
(1) The binding energies of Ols electrons for O2− ion existing in various metallic oxides generally decreased with decreasing electronegativity of metallic ion and ion-oxygen attraction.
(2) The shift of Ols binding energy for O2− ion in MeO was about two times as many as that for O− ion in 2 MeO·SiO2 compounds, when those were based on the Ols binding energy for O0 ion in SiO2.
(3) The XPS spectra obtained for binally silicates showed that the Ols spectra fitted three overlapped peaks, when all the peaks were constrained to the Lorentz shape and the values of Ols binding energy and width at half-maximum obtained for three kinds of oxygen ions, by the use of an electronic computer. Consequantly, the quantitative analysis of O0, O− and O2− ions existing in the binally silicate may be possible.
