Transmission Electron Microscopy of Lattice Defects in C₆₀/C₇₀ Epitaxial Films Evaporated on Mica Substrate

Abstract

An epitaxial C₆₀/C₇₀ film with the (111)_fcc\varparallelsubstrate surface was deposited on a mica substrate heated to 573 K. Transmission electron microscopy revealed straight contrasts parallel to the ⟨1\bar10⟩ directions (defect A) and irregularly curved contrasts (defect B) in the film.
(a) The film contained a lot of doubly-positioned twins (or 180° rotation twins about the [111] axis, while there was none of other ⟨11\bar1⟩-axes). Some of defects B were twin boundaries between the doubly-positioned twin domains. A few of defects A were {11\bar2} incoherent twin boundaries.
(b) Most of defects A and B were identified as stacking faults. Defects B were conposed of a complex of stacking fault jogs.