日本結晶成長学会誌
Online ISSN : 2187-8366
Print ISSN : 0385-6275
ISSN-L : 0385-6275
Si(001)微斜面におけるドメイン反転現象の数値解析
近江 弘和和田 宏
著者情報
ジャーナル フリー

1997 年 24 巻 2 号 p. 137-

詳細
抄録
The microscopic mechanism of the currentinduced domain conversion phenomena on the Si(00l)vicinal surface is studied on the basis of the kinetic,equation derived by the path probability method(PPM)of noncquilibrium statistical method. The results of numerical calculation suggest that the domain conversion is caused by the anisotropy of binding energy of neighboring atoms along with the Schwoebel effect at steps under heating current.
著者関連情報
© 1997 日本結晶成長学会
前の記事 次の記事
feedback
Top