Development of combinatorial defect analysis with an intense positron microprobe

Nagayasu Oshima; Yasuhiro Kamada; Hideo Watanabe; Atsushi Kinomura; Ryoichi Suzuki

doi:10.56646/jjapcp.2.0_011306

2nd Japan-China Joint Workshop on Positron Science (JWPS2013)

セッションID: 011306

DOI https://doi.org/10.56646/jjapcp.2.0_011306

会議情報

主催: The organizing committee of JWPS2013

会議名: 2nd Japan-China Joint Workshop on Positron Science (JWPS2013)

開催地: Tsukuba, Japan

開催日: 2013/12/20 - 2013/12/23

Advances in analytical techniques and instrumentation

Development of combinatorial defect analysis with an intense positron microprobe

Nagayasu Oshima, Yasuhiro Kamada, Hideo Watanabe, Atsushi Kinomura, Ryoichi Suzuki

著者情報

会議録・要旨集オープンアクセス

詳細

抄録

The concept of combinatorial defect/pore analysis using an intense positron microprobe is proposed. This combinatorial method is suitable to analyze defects/pores for a large number of samples systematically. A test of this method was performed by applying it to the analysis of ion beam irradiated Fe film samples.

責任著者(Corresponding author)

J-STAGEへの登録はこちら（無料）