抄録
Electronic Speckle Pattern Interferometry (ESPI) is a promising experimental technique to investigate whole-field deformation analysis. The technique has been developed to make possible to observe dynamic feature of deformation in dynamic ESPI. In this paper, a dual-beam, in-plane sensitive DESPI is applied to observe an entire process of tensile tests of Al-alloy samples. Moving features of strain localized bands (SLB) which propagate over the sample is precisely investigated. A quantitative phase analysis by addition-subtraction method is also presented.
