抄録
Effects of the dopants on the electrical properties of the Ni-electrode multilayer ceramic capacitors have been studied. It is shown that the life time of insulation resistance under Highly Accelerated Life Testing (HALT) become much longer by doping with Y2O3 or V2O5 into dielectrics. There are many dislocation loops in the additive-free dielectric and they disappear by doping with Y2O3. It is supposed that Y plays the role of donar dopant compensating the oxygen vacancies which have a deleterious effect on the life time under HALT.
