粉体および粉末冶金
Online ISSN : 1880-9014
Print ISSN : 0532-8799
ISSN-L : 0532-8799
Ni内部電極積層セラミックコンデンサの絶縁抵抗に及ぼす薄層化の影響
岩永 大介中野 幸恵宮内 真理日比 貴子野村 武史
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ジャーナル オープンアクセス

2001 年 48 巻 1 号 p. 34-38

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抄録
The effect of thinning dielectric layers on the insulation resistance of MLCCs with Ni-electrode has been studied with special reference to the microstructure. Thinning dielectric layers is effective to achieve large capacitance MLCCs. In this study, MLCCs which are consisted of 1.9μm dielectric layer thickness with one grain are evaluated. The insulation resistance (IR) of MLCCs with a 1.9μm active layer thickness changed from 105 to 1011 Ω·cm by reoxidation treatment. In order to explain the increase of the IR after annealing, the distribution of element was investigated using TEM-EDS and EPMA. As a result of analysis, segregated Mn in active layer has disappeared after annealing. These phenomena suggested that the IR faults were caused by the segregated phases.
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© 社団法人粉体粉末冶金協会

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https://creativecommons.org/licenses/by-nc-nd/4.0/deed.ja
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