Abstract
The crystal structure and thermoelectric properties of Mn1-xCrxTe (0≤x≤0.3) films prepared on glass substrates by vacuum evaporation were investigated. X-ray diffraction measurements showed that the solubility limit of Cr in the NiAs-type MnTe phase for Mn1-xCrxTe films is x=0.06. For films in which 0≤x≤0.06, the Neel temperature TNopt, which was determined from the deflection point in the temperature dependence curve of the optical band gap, shifts strongly toward higher temperatures from TNopt,=327 K (x=0) to TNopt,=460 K (x=0.06) with an increase in x. The Seebeck coefficient S of the films reaches a maximum around TNopt, indicating that the enhancement of S can be attributed to the magnon-drag effect. On the other hand, for x >0.06, the temperature at which S reaches a maximum does not change with x, and S decreases markedly owing to the presence of a metallic Cr2Te3 phase.
